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Pages: 303 – 319
DOI: https://dx.doi.org/10.4310/MRL.2001.v8.n3.a7
Hing-Sun Luk (The Chinese University of Hong Kong)
Stephen S. T. Yau (University of Illinois at Chicago)
Larn-Ying Yeh (Kunshan Institute of Technology)
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Published 1 January 2001